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| DIMS™ (Defect Image Management
System) |
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| Semiconductor Line Processor |
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| Fab Vision/SI |
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| The Cheongju business site of Hynix
Semiconductor Inc. |
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| - Computerization of the manufacturing
history, reduction of input time, and the endowment of input
accuracy |
| - Realization of a paperless FAB
environment |
| - Ability to perform effective
real-time processing review and management, through the analysis
of trend graphs |
| - Easy reporting and drawing support
through the use of Excel and BMP Export |
| - Ability to directly connect and
receive/send data to or via various existing internal computer
networks (D/B , R/V or FTP etc…) |
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| - DIMS is a Vision /SI application
used in the LOT GRADING process of FABOUT (Outgoing), the final
stage of the semiconductor manufacturing line of LOT GRADING. |
| - DIMS saves accurate Defect Image
using the Vision Camera connected to the SCOPE equipment, and
support Defect Classification, according to the operator’s preference,
and then automatically classify and save the defect-related
data. |
| - Data and images are automatically
collected into the central server, so that the office-based
manager can always easily refer to the Defect Trend any time
necessary, and build a report by exporting it to Excel or a
drawing board. |
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